19-Inch Subrack Components for Automated Test Systems
Automated Test Equipment (ATE) combines multiple electronic modules to perform automated measurement, inspection, and functional testing. A typical ATE system may include test instruments, switching modules, signal-conditioning boards, data acquisition cards, power supplies, control computers, and communication modules.
19-inch subrack components provide the mechanical infrastructure that holds these modules together and allows the test system to operate as a modular platform.
A typical ATE system may include test instruments, switching modules, signal-conditioning boards, data acquisition cards, power supplies, control computers, and communication modules.
ATE Applications
19-inch subrack components can be used across different types of automated test equipment.
Semiconductor Test
- IC test equipment
- Semiconductor ATE
- Mixed-signal testing
- Digital test systems
- Wafer test equipment
PCBA Testing
- Functional test
- In-circuit test
- Boundary scan
- Programming
- Production test
Automotive Electronics
- ECU testing
- BMS testing
- Inverter testing
- Sensor testing
- Automotive communication testing
Telecom & RF Testing
- Network equipment testing
- RF testing
- Optical communication testing
- High-speed communication testing
Power Electronics Testing
- Power supply testing
- Converter testing
- Inverter testing
- Energy-storage testing
Industrial Electronics
- PLC testing
- Industrial controller testing
- I/O testing
- Data acquisition
Why 19-Inch Architecture Works Well for ATE
ATE systems frequently change during their product lifecycle.
A manufacturer may need to add:
- More test channels
- New measurement modules
- Additional switching
- New communication interfaces
- Higher-performance processing
A modular 19-inch architecture allows the electronic configuration to evolve without completely redesigning the mechanical platform.
